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Diagnosability of Nonlinear Circuits and Systems?Part I: The dc Case
November 1981 (vol. 30 no. 11)
pp. 889-898
V. Visvanathan, Department of Electrical Engineering and Computer Sciences, University of California
A theory for the diagnosabilty of nonlinear dc circuits (memoryless systems) is developed. Based on an input-output model, a necessary and sufficient condition for the local diagnosability of the system, which is a rank test on a matrix, is derived. Various ways of reducing the computational complexity of this test are indicated. A sufficient condition for single fault diagnosability, which is much weaker than the necessary and sufficient condition for local diagnosability, is also derived. It is also shown that for diagnosable systems, it is possible to to pick a finite number of test inputs that are sufficient to diagnose the system. An illustrative example is presented.
Index Terms:
test matrix, Genericity, input-output model, Jacobian, local diagnosability, nonlinear resistive circuits, single fault diagnosability
Citation:
V. Visvanathan, A. Sangiovanni-Vincentelli, "Diagnosability of Nonlinear Circuits and Systems?Part I: The dc Case," IEEE Transactions on Computers, vol. 30, no. 11, pp. 889-898, Nov. 1981, doi:10.1109/TC.1981.1675720
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