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November 1981 (vol. 30 no. 11)
pp. 866-875
E.J. McCluskey, Center for Reliable Computing, Computer Systems Laboratory, Departments of Computer Science and Electrical Engineering, Stanford University
A technique for modifying networks so that they are capable of self test is presented. The major innovation is partitioning the network into subnetworks with sufficiently few inputs that exhaustive testing of the subnetworks is possible.
Index Terms:
VLSI testing, Built-in test, CMOS testing, design for testability, exhaustive testing, partitioning, self-test, signature analysis, stuck- open faults, test pattern generation
Citation:
E.J. McCluskey, S. Bozorgui-Nesbat, "Design for Autonomous Test," IEEE Transactions on Computers, vol. 30, no. 11, pp. 866-875, Nov. 1981, doi:10.1109/TC.1981.1675717
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