This Article 
 Bibliographic References 
 Add to: 
Fault-Diagnosis for a Class of Multistage Interconnection Networks
October 1981 (vol. 30 no. 10)
pp. 743-758
null Tse-Yun Feng, Department of Computer and Information Science, The Ohio State University
To study the fault-diagnosis method for a class of multistage interconnection networks a general fault model is first constructed. Specific steps for diagnosing single faults and detecting multiple faults in interconnection networks such as the indirect binary n-cube network and the flip network are then developed. The following results are derived in this study: 1) independent of the network size, only four tests are required for detecting a single fault; 2) the number of tests required for locating a single fault and determining the fault type ranges from 4 to max(12, 6 + 2 ?log2(log2N)?) except for four types of single faults in the switching elements which cannot be pinpointed at the switching element level where N is the number of inputs/outputs; 3) only four tests are required for locating a single fault if the switching element is designed in such a way that any physical defection of the switching element causes both outputs of the related switching element to be faulty; and 4) multiple faults can be detected by 2(1 + log2N) tests.
Index Terms:
single fault, Baseline network, fault detection and location, fault model, multiple faults, multistage interconnection networks, parallel processing
null Tse-Yun Feng, null Chuan-Lin Wu, "Fault-Diagnosis for a Class of Multistage Interconnection Networks," IEEE Transactions on Computers, vol. 30, no. 10, pp. 743-758, Oct. 1981, doi:10.1109/TC.1981.1675693
Usage of this product signifies your acceptance of the Terms of Use.