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Issue No.08 - August (1981 vol.30)
pp: 606-608
J. Savir , IBM T. J. Watson Research Center
ABSTRACT
In [1] and [2] a method of designing syndrome-testable combinational circuits was described. It was shown that, in general, syndrome-testable combinational circuits require some pin-penalty and maybe some logic for producing the testable design.
INDEX TERMS
unate function, Inversion parity, reconvergent fan-out
CITATION
J. Savir, "Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits", IEEE Transactions on Computers, vol.30, no. 8, pp. 606-608, August 1981, doi:10.1109/TC.1981.1675849
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