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Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits
August 1981 (vol. 30 no. 8)
pp. 606-608
J. Savir, IBM T. J. Watson Research Center
In [1] and [2] a method of designing syndrome-testable combinational circuits was described. It was shown that, in general, syndrome-testable combinational circuits require some pin-penalty and maybe some logic for producing the testable design.
Index Terms:
unate function, Inversion parity, reconvergent fan-out
Citation:
J. Savir, "Syndrome-Testing of " Syndrome-Untestable" Combinational Circuits," IEEE Transactions on Computers, vol. 30, no. 8, pp. 606-608, Aug. 1981, doi:10.1109/TC.1981.1675849
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