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Issue No.08 - August (1981 vol.30)
pp: 604-606
G. Markowsky , IBM T. J. Watson Research Center
ABSTRACT
In [1] and [2] Savir developed many facets of syndrome-testing (checking the number of minterms realized by a circuit against the number realized by a fault-free version of that circuit) and presented evidence showing that syndrome-testing can be used in many practical circuits to detect all single faults. In some cases, where syndrome-testing did not detect all single stuck-at-faults, Savir showed that by the addition of a small number of additional "control" inputs and gates one would get a function which is syndrome-testable for all single stuck-at faults, and yet which realizes the original function when the "control" inputs are fed appropriate values. However, he left open the question of whether one could always modify a circuit to achieve syndrome-testability. In this correspondence we show that a combinatorial circuit can always be modified to produce a single-fault, syndrome-testable circuit.
INDEX TERMS
syndrome testability, Circuit modification, stuck-at-faults
CITATION
G. Markowsky, "Syndrome-Testability Can be Achieved by Circuit Modification", IEEE Transactions on Computers, vol.30, no. 8, pp. 604-606, August 1981, doi:10.1109/TC.1981.1675848
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