This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Syndrome-Testability Can be Achieved by Circuit Modification
August 1981 (vol. 30 no. 8)
pp. 604-606
G. Markowsky, IBM T. J. Watson Research Center
In [1] and [2] Savir developed many facets of syndrome-testing (checking the number of minterms realized by a circuit against the number realized by a fault-free version of that circuit) and presented evidence showing that syndrome-testing can be used in many practical circuits to detect all single faults. In some cases, where syndrome-testing did not detect all single stuck-at-faults, Savir showed that by the addition of a small number of additional "control" inputs and gates one would get a function which is syndrome-testable for all single stuck-at faults, and yet which realizes the original function when the "control" inputs are fed appropriate values. However, he left open the question of whether one could always modify a circuit to achieve syndrome-testability. In this correspondence we show that a combinatorial circuit can always be modified to produce a single-fault, syndrome-testable circuit.
Index Terms:
syndrome testability, Circuit modification, stuck-at-faults
Citation:
G. Markowsky, "Syndrome-Testability Can be Achieved by Circuit Modification," IEEE Transactions on Computers, vol. 30, no. 8, pp. 604-606, Aug. 1981, doi:10.1109/TC.1981.1675848
Usage of this product signifies your acceptance of the Terms of Use.