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Fault Diagnosis in a Boolean n Cube Array of Microprocessors
August 1981 (vol. 30 no. 8)
pp. 587-590
J.R. Armstrong, Department of Electrical Engineering, Virginia Polytechnic Institute and the State University of Virginia
Fault- tolerant characteristics of a Boolean n cube array of microprocessors are analyzed. Connectivity properties of the network graph are used to show that n processor or link failures are required to isolate a processor. For processor failures the network is shown to be n (one step) diagnosable. A testing algorithm is presented which can diagnose up to n processor failures.
Index Terms:
network, Array, diagnosability, faults, fault tolerance, microprocessor
Citation:
J.R. Armstrong, F.G. Gray, "Fault Diagnosis in a Boolean n Cube Array of Microprocessors," IEEE Transactions on Computers, vol. 30, no. 8, pp. 587-590, Aug. 1981, doi:10.1109/TC.1981.1675844
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