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Issue No.08 - August (1981 vol.30)
pp: 582-587
V.D. Agrawal , Bell Laboratories
ABSTRACT
The concepts of information theory are applied to the problem of testing digital circuits. By analyzing the information throughput of the circuit an expression for the probability of detecting a hardware fault is derived. Examples are given to illustrate an application of the present study in designing efficient pattern generators for testing.
INDEX TERMS
test generation, Logic testing, statistical communication theory, statistical testing
CITATION
V.D. Agrawal, "An Information Theoretic Approach to Digital Fault Testing", IEEE Transactions on Computers, vol.30, no. 8, pp. 582-587, August 1981, doi:10.1109/TC.1981.1675843
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