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Issue No.05 - May (1981 vol.30)
pp: 356-358
null Se June Hong , IBM T. J. Watson Research Center
ABSTRACT
A simple procedure to produce a minimum length test set for a parity network is presented. If M is the largest fan in of any EX-OR gate element in the tree, 2M test patterns are chosen by considering only 2M test sequences, of length 2M, assigned to each signal line.
INDEX TERMS
parity tree, EX-OR gate, optimum testing
CITATION
null Se June Hong, D.L. Ostapko, "A Simple Procedure to Generate Optimum Test Patterns for Parity Logic Networks", IEEE Transactions on Computers, vol.30, no. 5, pp. 356-358, May 1981, doi:10.1109/TC.1981.1675793
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