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Synchronous Sequential Machines: A Modular and Testable Design
November 1980 (vol. 29 no. 11)
pp. 1020-1025
K.K. Saluja, Department of Electrical Engineering, University of Newcastle
It will be shown that a single-input n-definite machine realized by a universal modular tree, in which each module consists of AND-EXCLUSIVE-OR-DELAY (AND-EOR-DELAY) as a basic element, can be tested for single stuck-type-faults by tests of length 2n + 3 only. This is a marked improvement over the previous results for trees consisting of AND-OR-DELAYS, which are known to have test lengths of exponential growth.
Index Terms:
universal modular tree, Combination circuits, fault detection, sequential machines, single-feedback realization, test sequence
Citation:
K.K. Saluja, "Synchronous Sequential Machines: A Modular and Testable Design," IEEE Transactions on Computers, vol. 29, no. 11, pp. 1020-1025, Nov. 1980, doi:10.1109/TC.1980.1675499
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