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Issue No.07 - July (1980 vol.29)
pp: 673-678
J. Savir , IBM Thomas J. Watson Research Center
ABSTRACT
Testing for intermittent faults in digital circuits has been given significant attention in the past few years. However, very little theoretical work was done regarding their detection in sequential circuits.
INDEX TERMS
state table, Error latency, deterministic and random testing, input probability, intermittent fault, Markov chain, sequential circuit
CITATION
J. Savir, "Detection of Single Intermittent Faults in Sequential Circuits", IEEE Transactions on Computers, vol.29, no. 7, pp. 673-678, July 1980, doi:10.1109/TC.1980.1675642
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