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| ASCII Text | x | ||
| D. Etiemble, "Multivalued I<sup>2</sup>L Circuits for TSC Checkers," IEEE Transactions on Computers, vol. 29, no. 6, pp. 537-540, June, 1980. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1980.1675616, author = {D. Etiemble}, title = {Multivalued I<sup>2</sup>L Circuits for TSC Checkers}, journal ={IEEE Transactions on Computers}, volume = {29}, number = {6}, issn = {0018-9340}, year = {1980}, pages = {537-540}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1980.1675616}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Multivalued I<sup>2</sup>L Circuits for TSC Checkers IS - 6 SN - 0018-9340 SP537 EP540 EPD - 537-540 A1 - D. Etiemble, PY - 1980 KW - totally self-checking comparator KW - Error-detecting codes KW - I KW - multivalued logic KW - totally self-checking checkers VL - 29 JA - IEEE Transactions on Computers ER - | |||
We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.
Index Terms:
totally self-checking comparator, Error-detecting codes, I, multivalued logic, totally self-checking checkers
Citation:
D. Etiemble, "Multivalued I2L Circuits for TSC Checkers," IEEE Transactions on Computers, vol. 29, no. 6, pp. 537-540, June 1980, doi:10.1109/TC.1980.1675616
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