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June 1980 (vol. 29 no. 6)
pp. 537-540
D. Etiemble, Institut de Programmation, Universite Pierre et Marie Curie
We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.
Index Terms:
totally self-checking comparator, Error-detecting codes, I, multivalued logic, totally self-checking checkers
Citation:
D. Etiemble, "Multivalued I2L Circuits for TSC Checkers," IEEE Transactions on Computers, vol. 29, no. 6, pp. 537-540, June 1980, doi:10.1109/TC.1980.1675616
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