Issue No.06 - June (1980 vol.29)
D. Etiemble , Institut de Programmation, Universite Pierre et Marie Curie
We present a TSC multivalued I2L comparator which uses multivalued current inputs and two binary voltage outputs. This circuit is self-testing and fault-secure for single faults (either "stuck-at" or "skew" faults). It is the basic circuit to realize TSC checkers for nonseparable or separable codes. The schemes are simpler than the designs of the TSC combinational checkers.
totally self-checking comparator, Error-detecting codes, I, multivalued logic, totally self-checking checkers
D. Etiemble, "Multivalued I<sup>2</sup>L Circuits for TSC Checkers", IEEE Transactions on Computers, vol.29, no. 6, pp. 537-540, June 1980, doi:10.1109/TC.1980.1675616