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Issue No.06 - June (1980 vol.29)
pp: 532-537
Y. Crouzet , Laboratoire d'Automatique et d'Analyse des Systemes du CNRS
Self-checking approaches developed so far deal with a gate level representation of logical circuits. They do not account for constraints which may result from an implementation by integrated circuits. This paper is concerned with such practical problems and their respective significance.
self-checking LSI circuits, Coding, fault detection, self-checking
Y. Crouzet, C. Landrault, "Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor", IEEE Transactions on Computers, vol.29, no. 6, pp. 532-537, June 1980, doi:10.1109/TC.1980.1675615
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