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Minimal Detecting Transition Sequences: Application to Random Testing
June 1980 (vol. 29 no. 6)
pp. 514-518
R. David, Laboratoire d'Automatique, Institut National Polytechnique de Grenoble
This paper presents the new notion of minimal detecting transition sequence (MDTS). A detectable fault f in a circuit C is detected by any MDTS in a set Df called detection set associated with f. From a prescribed set of faults, we obtain a list of detection sets. This list of detection sets is calculated once for all, for a given circuit C. Once this list bas been obtained for a circuit, it may be used either to generate a deterministic test sequence, or to calculate random testing lengths within various hypothesis (input vector probabilities).
Index Terms:
transition sequence, Detection set, minimal detecting transition sequence(MDTS), random testing, sequential circuit
Citation:
R. David, P. Thevenod-Fosse, "Minimal Detecting Transition Sequences: Application to Random Testing," IEEE Transactions on Computers, vol. 29, no. 6, pp. 514-518, June 1980, doi:10.1109/TC.1980.1675611
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