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Issue No.06 - June (1980 vol.29)
pp: 514-518
R. David , Laboratoire d'Automatique, Institut National Polytechnique de Grenoble
ABSTRACT
This paper presents the new notion of minimal detecting transition sequence (MDTS). A detectable fault f in a circuit C is detected by any MDTS in a set Df called detection set associated with f. From a prescribed set of faults, we obtain a list of detection sets. This list of detection sets is calculated once for all, for a given circuit C. Once this list bas been obtained for a circuit, it may be used either to generate a deterministic test sequence, or to calculate random testing lengths within various hypothesis (input vector probabilities).
INDEX TERMS
transition sequence, Detection set, minimal detecting transition sequence(MDTS), random testing, sequential circuit
CITATION
R. David, "Minimal Detecting Transition Sequences: Application to Random Testing", IEEE Transactions on Computers, vol.29, no. 6, pp. 514-518, June 1980, doi:10.1109/TC.1980.1675611
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