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Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis
June 1980 (vol. 29 no. 6)
pp. 451-460
M. Abramovici, Bell Laboratories
In this paper we present a new approach to multiple fault diagnosis in combinational circuits based on an effect-cause analysis. The main vehicle of our approach is the deduction of internal line values in a circuit under test N*. The knowledge of these values allows us to identify fault situations in N* (causes) which are compatible with the applied test and the obtained response (the effect). A fault situation specifies faulty as well as fault-free lines. Other applications include identifying the existence of nonstuck faults in N* and determination of faults not detected by a given test, including redundant faults. The latter application allows for the generation of tests for multiple faults without performing fault enumeration.
Index Terms:
multiple stuck-at faults, Combinational networks, deduction of internal values, effect-cause analysis, fault diagnosis, multiple redundant faults
Citation:
M. Abramovici, M.A. Breuer, "Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis," IEEE Transactions on Computers, vol. 29, no. 6, pp. 451-460, June 1980, doi:10.1109/TC.1980.1675604
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