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Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories
June 1980 (vol. 29 no. 6)
pp. 419-429
D.S. Suk, Bell Laboratories
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.
Index Terms:
semiconductor random- access memories, Pattern-sensitive faults
Citation:
D.S. Suk, S.M. Reddy, "Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories," IEEE Transactions on Computers, vol. 29, no. 6, pp. 419-429, June 1980, doi:10.1109/TC.1980.1675601
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