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Issue No.06 - June (1980 vol.29)
pp: 419-429
D.S. Suk , Bell Laboratories
ABSTRACT
A class of pattern-sensitive faults in semiconductor random-access memories are studied. Efficient test procedures to detect and locate modeled faults are presented.
INDEX TERMS
semiconductor random- access memories, Pattern-sensitive faults
CITATION
D.S. Suk, S.M. Reddy, "Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories", IEEE Transactions on Computers, vol.29, no. 6, pp. 419-429, June 1980, doi:10.1109/TC.1980.1675601
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