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Functional Level Primitives in Test Generation
March 1980 (vol. 29 no. 3)
pp. 223-235
M.A. Breuer, Department of Electrical Engineering and Department of Computer Science, University of Southern California
This paper deals with the use and development of high-level (functional) primitive logic elements for use in a system which automatically generates tests for complex sequential circuits. The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented. Functional test generation models for two basic elements, a shift register and a counter, are derived, including procedures for implication, D-drive and line justification. Primitive algorithms which generate single as well as multivector (sequences) solutions to D-drive and line justification problems are presented.
Index Terms:
test sequences, Fault detection, fault diagnosis, functional level modeling, functional test generation
Citation:
M.A. Breuer, A.D. Friedman, "Functional Level Primitives in Test Generation," IEEE Transactions on Computers, vol. 29, no. 3, pp. 223-235, March 1980, doi:10.1109/TC.1980.1675554
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