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Functional Level Primitives in Test Generation
March 1980 (vol. 29 no. 3)
pp. 223-235
| ASCII Text | x | ||
| M.A. Breuer, A.D. Friedman, "Functional Level Primitives in Test Generation," IEEE Transactions on Computers, vol. 29, no. 3, pp. 223-235, March, 1980. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1980.1675554, author = {M.A. Breuer and A.D. Friedman}, title = {Functional Level Primitives in Test Generation}, journal ={IEEE Transactions on Computers}, volume = {29}, number = {3}, issn = {0018-9340}, year = {1980}, pages = {223-235}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1980.1675554}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Functional Level Primitives in Test Generation IS - 3 SN - 0018-9340 SP223 EP235 EPD - 223-235 A1 - M.A. Breuer, A1 - A.D. Friedman, PY - 1980 KW - test sequences KW - Fault detection KW - fault diagnosis KW - functional level modeling KW - functional test generation VL - 29 JA - IEEE Transactions on Computers ER - | |||
This paper deals with the use and development of high-level (functional) primitive logic elements for use in a system which automatically generates tests for complex sequential circuits. The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented. Functional test generation models for two basic elements, a shift register and a counter, are derived, including procedures for implication, D-drive and line justification. Primitive algorithms which generate single as well as multivector (sequences) solutions to D-drive and line justification problems are presented.
Index Terms:
test sequences, Fault detection, fault diagnosis, functional level modeling, functional test generation
Citation:
M.A. Breuer, A.D. Friedman, "Functional Level Primitives in Test Generation," IEEE Transactions on Computers, vol. 29, no. 3, pp. 223-235, March 1980, doi:10.1109/TC.1980.1675554
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