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Issue No.03 - March (1980 vol.29)
pp: 223-235
M.A. Breuer , Department of Electrical Engineering and Department of Computer Science, University of Southern California
This paper deals with the use and development of high-level (functional) primitive logic elements for use in a system which automatically generates tests for complex sequential circuits. The concept of solution sequences to test problems for primitive elements is introduced and a functional language used to describe solution sequences is presented. Functional test generation models for two basic elements, a shift register and a counter, are derived, including procedures for implication, D-drive and line justification. Primitive algorithms which generate single as well as multivector (sequences) solutions to D-drive and line justification problems are presented.
test sequences, Fault detection, fault diagnosis, functional level modeling, functional test generation
M.A. Breuer, A.D. Friedman, "Functional Level Primitives in Test Generation", IEEE Transactions on Computers, vol.29, no. 3, pp. 223-235, March 1980, doi:10.1109/TC.1980.1675554
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