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Issue No.02 - February (1980 vol.29)
pp: 125-134
R.A. Cliff , NASA Goddard Space Flight Center
ABSTRACT
If a VLSI chip is partitioned into functional units (FU's) and redundant FU's are added, error correcting codes may be employed to increase the yield and/or reliability of the chip. Acceptable testing is defined to be testing the chip with the error corrector functioning, thus obtaining the maximum increase in yield afforded by the error correction. The acceptable testing theorem shows that the use of coding and error correction in conjunction with acceptable testing can significantly increase the yield of VLSI chips without seriously compromising their reliability.
INDEX TERMS
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CITATION
R.A. Cliff, "Acceptable Testing of VLSI Components Which Contain Error Correctors", IEEE Transactions on Computers, vol.29, no. 2, pp. 125-134, February 1980, doi:10.1109/TC.1980.1675536
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