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On Redundancy and Fault Detection in Sequential Circuits
November 1979 (vol. 28 no. 11)
pp. 864-865
M. Abramovici, Department of Electrical Engineering, University of Southern California
In this correspondence we show that the well-known concepts of redundancy and undetectability of a stuck-at fault, which are equivalent in combinational circuits, are not equivalent in sequential circuits. We also show that some faults in sequential circuits, which are undetectable (by "conventional" methods of testing), are detectable by transition count testing methods.
Index Terms:
transition count testing, Combinational and sequential circuits, fault detection, redundancy, testing
Citation:
M. Abramovici, M.A. Breuer, "On Redundancy and Fault Detection in Sequential Circuits," IEEE Transactions on Computers, vol. 28, no. 11, pp. 864-865, Nov. 1979, doi:10.1109/TC.1979.1675267
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