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| ASCII Text | x | ||
| M. Abramovici, M.A. Breuer, "On Redundancy and Fault Detection in Sequential Circuits," IEEE Transactions on Computers, vol. 28, no. 11, pp. 864-865, November, 1979. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1979.1675267, author = {M. Abramovici and M.A. Breuer}, title = {On Redundancy and Fault Detection in Sequential Circuits}, journal ={IEEE Transactions on Computers}, volume = {28}, number = {11}, issn = {0018-9340}, year = {1979}, pages = {864-865}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1979.1675267}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - On Redundancy and Fault Detection in Sequential Circuits IS - 11 SN - 0018-9340 SP864 EP865 EPD - 864-865 A1 - M. Abramovici, A1 - M.A. Breuer, PY - 1979 KW - transition count testing KW - Combinational and sequential circuits KW - fault detection KW - redundancy KW - testing VL - 28 JA - IEEE Transactions on Computers ER - | |||
In this correspondence we show that the well-known concepts of redundancy and undetectability of a stuck-at fault, which are equivalent in combinational circuits, are not equivalent in sequential circuits. We also show that some faults in sequential circuits, which are undetectable (by "conventional" methods of testing), are detectable by transition count testing methods.
Index Terms:
transition count testing, Combinational and sequential circuits, fault detection, redundancy, testing
Citation:
M. Abramovici, M.A. Breuer, "On Redundancy and Fault Detection in Sequential Circuits," IEEE Transactions on Computers, vol. 28, no. 11, pp. 864-865, Nov. 1979, doi:10.1109/TC.1979.1675267
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