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Diagnosing Single Faults in Fanout-Free Combinational Circuits
November 1979 (vol. 28 no. 11)
pp. 863-864
G. Markowsky, Department of Computer Sciences, IBM T. J. Watson Research Center
We show how to construct, in a simple manner, a test set having n + 1 tests for a fanout-free combinational circuit with n primary inputs which distinguishes (diagnoses) nonequivalent single faults. This result is an improvement over the upper bound in [1, Theorem 3.9] of n + g (g is the number of primary input gates) and the upper bound in [3, Theorem 4], [5] of 2n for the least number of tests required to distinguish among nonequivalent single faults.
Index Terms:
test set, Algorithm, diagnosing single faults, fanout-free combinatorial circuits, stuck line fault
Citation:
G. Markowsky, "Diagnosing Single Faults in Fanout-Free Combinational Circuits," IEEE Transactions on Computers, vol. 28, no. 11, pp. 863-864, Nov. 1979, doi:10.1109/TC.1979.1675266
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