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Diagnosing Single Faults in Fanout-Free Combinational Circuits
November 1979 (vol. 28 no. 11)
pp. 863-864
ASCII Text
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G. Markowsky, "Diagnosing Single Faults in Fanout-Free Combinational Circuits," IEEE Transactions on Computers, vol. 28, no. 11, pp. 863-864, November, 1979.
 
 
BibTex
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@article{ 10.1109/TC.1979.1675266,
author = {G. Markowsky},
title = {Diagnosing Single Faults in Fanout-Free Combinational Circuits},
journal ={IEEE Transactions on Computers},
volume = {28},
number = {11},
issn = {0018-9340},
year = {1979},
pages = {863-864},
doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1979.1675266},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - JOUR
JO - IEEE Transactions on Computers
TI - Diagnosing Single Faults in Fanout-Free Combinational Circuits
IS - 11
SN - 0018-9340
SP863
EP864
EPD - 863-864
A1 - G. Markowsky,
PY - 1979
KW - test set
KW - Algorithm
KW - diagnosing single faults
KW - fanout-free combinatorial circuits
KW - stuck line fault
VL - 28
JA - IEEE Transactions on Computers
ER -
 
G. Markowsky, Department of Computer Sciences, IBM T. J. Watson Research Center
We show how to construct, in a simple manner, a test set having n + 1 tests for a fanout-free combinational circuit with n primary inputs which distinguishes (diagnoses) nonequivalent single faults. This result is an improvement over the upper bound in [1, Theorem 3.9] of n + g (g is the number of primary input gates) and the upper bound in [3, Theorem 4], [5] of 2n for the least number of tests required to distinguish among nonequivalent single faults.
Index Terms:
test set, Algorithm, diagnosing single faults, fanout-free combinatorial circuits, stuck line fault
Citation:
G. Markowsky, "Diagnosing Single Faults in Fanout-Free Combinational Circuits," IEEE Transactions on Computers, vol. 28, no. 11, pp. 863-864, Nov. 1979, doi:10.1109/TC.1979.1675266
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