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| ASCII Text | x | ||
| C.R. Kime, "An Abstract Model for Digital System Fault Diagnosis," IEEE Transactions on Computers, vol. 28, no. 10, pp. 754-767, October, 1979. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1979.1675243, author = {C.R. Kime}, title = {An Abstract Model for Digital System Fault Diagnosis}, journal ={IEEE Transactions on Computers}, volume = {28}, number = {10}, issn = {0018-9340}, year = {1979}, pages = {754-767}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1979.1675243}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - An Abstract Model for Digital System Fault Diagnosis IS - 10 SN - 0018-9340 SP754 EP767 EPD - 754-767 A1 - C.R. Kime, PY - 1979 KW - system diagnosis KW - Diagnostic modeling KW - diagnostic resolution KW - fault detection and location KW - multiple faults VL - 28 JA - IEEE Transactions on Computers ER - | |||
An abstract model applicable to the use of both diagnostic programs and hardware diagnostic aids in digital systems is presented. The model is capable of dealing with replaceable units having a variety of complexity and is shown in a mathematically rigorous fashion to encompass existing models for diagnosis. A three-level structure for representing faults and a two-level structure for representing tests are employed. Faults, multiple faults, tests, and test results are represented by sets. Relationships between these entities are represented by binary relations and functions.
Index Terms:
system diagnosis, Diagnostic modeling, diagnostic resolution, fault detection and location, multiple faults
Citation:
C.R. Kime, "An Abstract Model for Digital System Fault Diagnosis," IEEE Transactions on Computers, vol. 28, no. 10, pp. 754-767, Oct. 1979, doi:10.1109/TC.1979.1675243
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