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August 1979 (vol. 28 no. 8)
pp. 581
V.D. Agrawal, Bell Laboratories
P. B. Schneck is right in pointing out that maximum fan-in will lead to a more conservative estimate of the number of random patterns needed for complete testing. It is, however, useful to compare these estimates with practical cases. We will consider two examples.
Citation:
V.D. Agrawal, "Author's Reply," IEEE Transactions on Computers, vol. 28, no. 8, pp. 581, Aug. 1979, doi:10.1109/TC.1979.1675416
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