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August 1979 (vol. 28 no. 8)
pp. 580-581
P.B. Schneck, Goddard Space Flight Center
This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.
Index Terms:
primary inputs, Fan-in
Citation:
P.B. Schneck, "Comment on "When to Use Random Testing"," IEEE Transactions on Computers, vol. 28, no. 8, pp. 580-581, Aug. 1979, doi:10.1109/TC.1979.1675415
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