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I. Koren, Department of Electrical Engineering-Systems, University of Southern California
It is well known that static redundancy techniques are very efficient against intermittent (transient) faults which constitute a large portion of logic faults in digital systems. However, very little theoretical work has been done in evaluating the reliability of modular redundancy systems which are subject to intermittent malfunction occurrences. In this paper we present a statistical model for intermittent faults and use it to analyze the reliability of NMR systems in mixed intermittent and permanent fault environments.
Index Terms:
reliability, Digital system, intermittent fault, modular redundancy, permanent fault
Citation:
I. Koren, S.Y.H. Su, "Reliability Analysis of N-Modular Redundancy Systems with Intermittent and Permanent Faults," IEEE Transactions on Computers, vol. 28, no. 7, pp. 514-520, July 1979, doi:10.1109/TC.1979.1675397
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