This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
On the Design of Easily Testable Iterative Systems of Combinational Cells
May 1979 (vol. 28 no. 5)
pp. 367-371
W. Coy, Abteilung Informatik, Universit?t of Dortmund
A design procedure is shown which allows the construction of one-dimensional iterative systems of combinational cells with good single stuck-at fault test complexity. Let S be a system where one of the M input words and two of the N states are defined for test purposes and the cells are realized as AND?EXOR normal form circuits, then S is testable with at most [log2(M x N) + 6] tests fo
Index Terms:
stuck-at faults., Combinational cells, iterative systems
Citation:
W. Coy, "On the Design of Easily Testable Iterative Systems of Combinational Cells," IEEE Transactions on Computers, vol. 28, no. 5, pp. 367-371, May 1979, doi:10.1109/TC.1979.1675368
Usage of this product signifies your acceptance of the Terms of Use.