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Issue No.05 - May (1979 vol.28)
pp: 367-371
W. Coy , Abteilung Informatik, Universit?t of Dortmund
ABSTRACT
A design procedure is shown which allows the construction of one-dimensional iterative systems of combinational cells with good single stuck-at fault test complexity. Let S be a system where one of the M input words and two of the N states are defined for test purposes and the cells are realized as AND?EXOR normal form circuits, then S is testable with at most [log<inf>2</inf>(M x N) + 6] tests fo
INDEX TERMS
stuck-at faults., Combinational cells, iterative systems
CITATION
W. Coy, "On the Design of Easily Testable Iterative Systems of Combinational Cells", IEEE Transactions on Computers, vol.28, no. 5, pp. 367-371, May 1979, doi:10.1109/TC.1979.1675368
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