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Symmetry, Automorphism, and Test
April 1979 (vol. 28 no. 4)
pp. 319-325
C. Turcat, CEPHAG, Equipe de Recherche Associ?e du C.N.R.S.
This paper shows how network symmetries (or the graph-theory concept of automorphism) can be used to cluster faults into classes and thus simplify the process of finding a test set: tests for these automorphic classes are found by classical methods and then expanded using automorphisms to produce a test-set. The process does not seem more complex than the classical ones. Furthermore, by using a multilevel description, the process is easily extended to networks of modules.
Index Terms:
test., Automorphism, faults, symmetry
Citation:
C. Turcat, A. Verdillon, "Symmetry, Automorphism, and Test," IEEE Transactions on Computers, vol. 28, no. 4, pp. 319-325, April 1979, doi:10.1109/TC.1979.1675354
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