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Issue No.04 - April (1979 vol.28)
pp: 319-325
C. Turcat , CEPHAG, Equipe de Recherche Associ?e du C.N.R.S.
ABSTRACT
This paper shows how network symmetries (or the graph-theory concept of automorphism) can be used to cluster faults into classes and thus simplify the process of finding a test set: tests for these automorphic classes are found by classical methods and then expanded using automorphisms to produce a test-set. The process does not seem more complex than the classical ones. Furthermore, by using a multilevel description, the process is easily extended to networks of modules.
INDEX TERMS
test., Automorphism, faults, symmetry
CITATION
C. Turcat, A. Verdillon, "Symmetry, Automorphism, and Test", IEEE Transactions on Computers, vol.28, no. 4, pp. 319-325, April 1979, doi:10.1109/TC.1979.1675354
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