This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Unified Design of Self-Checking and Fail-Safe Combinational Circuits and Sequential Machines
March 1979 (vol. 28 no. 3)
pp. 276-281
M. Diaz, Laboratoire d'Automatique et d'Analyse des Systemes
This correspondence deals with a unification and extension of some previous work on self-checking (SC) and fail-safe (FS) systems.
Index Terms:
single and unidirectional faults, Fail-safe combinational circuits, fail-safe sequential machines, k-out-of-n codes, on-set realization, self-checking combinational circuits, self-checking sequential machines
Citation:
M. Diaz, P. Azema, J.M. Ayache, "Unified Design of Self-Checking and Fail-Safe Combinational Circuits and Sequential Machines," IEEE Transactions on Computers, vol. 28, no. 3, pp. 276-281, March 1979, doi:10.1109/TC.1979.1675338
Usage of this product signifies your acceptance of the Terms of Use.