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Issue No.01 - January (1979 vol.28)
pp: 85-86
R. David , Laboratoire d'Automatique, INP Grenoble
ABSTRACT
In the paper "The Error Latency of a Fault in a Sequential Digital Circuit," the method presented in [1] to evaluate the random test length to be applied to a sequential circuit, is called the "approximation method." We agree with this name, but wish to offer the following interpretations and clarifications (using the notations of Shedletsky and McCluskey<sup>1</sup>).
INDEX TERMS
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CITATION
R. David, R. Tellez-Giron, "Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"", IEEE Transactions on Computers, vol.28, no. 1, pp. 85-86, January 1979, doi:10.1109/TC.1979.1675230
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