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January 1979 (vol. 28 no. 1)
pp. 85-86
| ASCII Text | x | ||
| R. David, R. Tellez-Giron, "Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"," IEEE Transactions on Computers, vol. 28, no. 1, pp. 85-86, January, 1979. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1979.1675230, author = {R. David and R. Tellez-Giron}, title = {Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"}, journal ={IEEE Transactions on Computers}, volume = {28}, number = {1}, issn = {0018-9340}, year = {1979}, pages = {85-86}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1979.1675230}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Comments on "The Error Latency of a Fault in a Sequential Digital Circuit" IS - 1 SN - 0018-9340 SP85 EP86 EPD - 85-86 A1 - R. David, A1 - R. Tellez-Giron, PY - 1979 KW - null VL - 28 JA - IEEE Transactions on Computers ER - | |||
In the paper "The Error Latency of a Fault in a Sequential Digital Circuit," the method presented in [1] to evaluate the random test length to be applied to a sequential circuit, is called the "approximation method." We agree with this name, but wish to offer the following interpretations and clarifications (using the notations of Shedletsky and McCluskey1).
Citation:
R. David, R. Tellez-Giron, "Comments on "The Error Latency of a Fault in a Sequential Digital Circuit"," IEEE Transactions on Computers, vol. 28, no. 1, pp. 85-86, Jan. 1979, doi:10.1109/TC.1979.1675230
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