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A Functional Form Approach to Test Set Coverage in Tree Networks
January 1979 (vol. 28 no. 1)
pp. 50-52
V.K. Agarwal, Department of Electrical and Computer Engineering, Wayne State University
To efficiently perform the fault analysis of digital networks it is necessary that pertinent fault interrelationships be utilized. However, to determine these fault interrelationships can entail an analysis which is quite complex and thereby reduces the overall advantage of utilizing the gained insights in a fault analysis process. In this paper we suggest an approach to establishing the existence of a certain fault interrelationship relative to test set coverage in tree networks which is based only on the form of the output function. A procedure is given for generating a form expression (called an L-expression) corresponding to that function. A theorem is stated regarding the interpretation of these form expressions relative to test set coverage.
Index Terms:
multiple fault events, Complete test sets, coverage, fault complexes, functional form, generic form, L-expression
V.K. Agarwal, G.M. Masson, "A Functional Form Approach to Test Set Coverage in Tree Networks," IEEE Transactions on Computers, vol. 28, no. 1, pp. 50-52, Jan. 1979, doi:10.1109/TC.1979.1675221
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