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Fault Detection in Bilateral Arrays of Combinational Cells
December 1978 (vol. 27 no. 12)
pp. 1206-1213
F.G. Gray, Department of Electrical Engineering, Virginiblf'lytechnic Institute and State University
Sufficient conditions are derived that make multidimensional bilateral arrays of combinational cells easily testable for single faults. These conditions are easily implemented during the initial design of the arrays. No restrictions are made on the interconnection patterns or directions of signal flow in the arrays. The conditions are equally applicable to synchronous and asynchronous arrays. No assumptions of stability are made. Any functional fault in a single cell will be detected as long as the failed cell is still combinational. The test sequence is preset and grows linearly with the size of the array.
Index Terms:
preset test sequences, Bilateral arrays, combinational cells, design for reliability, design parameters, fault detection, functional faults, linear growth
F.G. Gray, R.A. Thompson, "Fault Detection in Bilateral Arrays of Combinational Cells," IEEE Transactions on Computers, vol. 27, no. 12, pp. 1206-1213, Dec. 1978, doi:10.1109/TC.1978.1675029
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