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Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results
October 1978 (vol. 27 no. 10)
pp. 911-923
Y.M. El-Ziq, Design Automation and Test Department, Sperry Univac
Metal-oxide-semiconductor (MOS) logic elements offer advantages over bipolar logic elements, such as smaller size, complexity, and power consumption, as well as more flexibility and versatility. Since MOS is playing a major role in large-scale integration (LSI), synthesis of MOS networks with a large number of variables is very important.
Index Terms:
testability, Boolean functions, combinational logic, combinational networks, computer algorithm, diagnosable networks, easily testable networks, field-effect transistors, logic design automation, logic synthesis, metal-oxide semiconductor, statistical data
Citation:
Y.M. El-Ziq, S.Y.H. Su, "Computer-Aided Logic Design of Two-Level MOS Combinational Networks with Statistical Results," IEEE Transactions on Computers, vol. 27, no. 10, pp. 911-923, Oct. 1978, doi:10.1109/TC.1978.1674970
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