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Issue No.09 - September (1978 vol.27)
pp: 828-832
null Siu-Chong Si , Department of Electrical Engineering, National Taiwan University
ABSTRACT
This paper is concerned with the detection of redundant leads in redundant logic networks. The concept of dynamic testing is introduced. We shall show that some traditionally caled undetectable faults may become detectable in dynamic testing, or how to make them become detectable in dynamic testing. Conditions for certain redundancies to be definitely untestable are also discussed.
INDEX TERMS
transient equations, Dynamic testing, fault detection, hazards, logic networks, static testing, SPOOF, transient analysis
CITATION
null Siu-Chong Si, "Dynamic Testing of Redundant Logic Networks", IEEE Transactions on Computers, vol.27, no. 9, pp. 828-832, September 1978, doi:10.1109/TC.1978.1675202
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