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An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories
November 1977 (vol. 26 no. 11)
pp. 1141-1144
J., Jr. Knaizuk, Department of Computer Science, State University College
This correspondence presents an optimal algorithm to detect any single "stuck-at-i," "stuck-at-O" fault and any combination of "stuck-at-I," "stuck-at-O" multiple faults in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2n memory accesses.
Index Terms:
Fault detection stuck-at aults, optimal algorithm, random access memories.
Citation:
J., Jr. Knaizuk, C.R.P. Hartmann, "An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories," IEEE Transactions on Computers, vol. 26, no. 11, pp. 1141-1144, Nov. 1977, doi:10.1109/TC.1977.1674761
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