This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Synthesis of Optimal Ambiguity Resolver Functions
August 1977 (vol. 26 no. 8)
pp. 782-789
M.A. Mehta, Digital Systems International
Large-scale integration (LSI) circuits impose particular constraints and present special opportunities for improving the diagnostic resolution of a digital system. In particular, bond failures represent a very significant failure mode in integrated circuits, so it is important to be able to identify a fault on an input/output lead to a single bus of a least replaceable unit, and it is desirable to do this using a minimum number of test points.
Index Terms:
Fault detection, logic circuits with special properties, optimal testing, special test functions.
Citation:
M.A. Mehta, W.B. Smith, "Synthesis of Optimal Ambiguity Resolver Functions," IEEE Transactions on Computers, vol. 26, no. 8, pp. 782-789, Aug. 1977, doi:10.1109/TC.1977.1674916
Usage of this product signifies your acceptance of the Terms of Use.