Issue No.08 - August (1977 vol.26)
M.A. Mehta , Digital Systems International
Large-scale integration (LSI) circuits impose particular constraints and present special opportunities for improving the diagnostic resolution of a digital system. In particular, bond failures represent a very significant failure mode in integrated circuits, so it is important to be able to identify a fault on an input/output lead to a single bus of a least replaceable unit, and it is desirable to do this using a minimum number of test points.
Fault detection, logic circuits with special properties, optimal testing, special test functions.
M.A. Mehta, W.B. Smith, "Synthesis of Optimal Ambiguity Resolver Functions", IEEE Transactions on Computers, vol.26, no. 8, pp. 782-789, August 1977, doi:10.1109/TC.1977.1674916