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An Algorithm for Testing Random Access Memories
April 1977 (vol. 26 no. 4)
pp. 414-416
J., Jr. Knaizuk, Department of Computer Science, State University College
This correspondence presents an optimal algorithm to detect any single stuck-at-1 (s-a-1), stuck-at-0 (s-a-0) fault in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2nmemory accesses.
Index Terms:
Fault detection, optimal algorithm, random access memory, single stuck-at-fault.
Citation:
J., Jr. Knaizuk, C.R.P. Hartmann, "An Algorithm for Testing Random Access Memories," IEEE Transactions on Computers, vol. 26, no. 4, pp. 414-416, April 1977, doi:10.1109/TC.1977.1674851
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