The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.04 - April (1977 vol.26)
pp: 414-416
J., Jr. Knaizuk , Department of Computer Science, State University College
ABSTRACT
This correspondence presents an optimal algorithm to detect any single stuck-at-1 (s-a-1), stuck-at-0 (s-a-0) fault in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2<sup>n</sup>memory accesses.
INDEX TERMS
Fault detection, optimal algorithm, random access memory, single stuck-at-fault.
CITATION
J., Jr. Knaizuk, C.R.P. Hartmann, "An Algorithm for Testing Random Access Memories", IEEE Transactions on Computers, vol.26, no. 4, pp. 414-416, April 1977, doi:10.1109/TC.1977.1674851
26 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool