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A Note on Testing Logic Circuits by Transition Counting
March 1977 (vol. 26 no. 3)
pp. 313-314
S.M. Reddy, Division of Information Engineering, University of Iowa
Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.
Index Terms:
Single and multiple faults, transition count testing.
Citation:
S.M. Reddy, "A Note on Testing Logic Circuits by Transition Counting," IEEE Transactions on Computers, vol. 26, no. 3, pp. 313-314, March 1977, doi:10.1109/TC.1977.1674831
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