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A Note on Testing Logic Circuits by Transition Counting
March 1977 (vol. 26 no. 3)
pp. 313-314
| ASCII Text | x | ||
| S.M. Reddy, "A Note on Testing Logic Circuits by Transition Counting," IEEE Transactions on Computers, vol. 26, no. 3, pp. 313-314, March, 1977. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1977.1674831, author = {S.M. Reddy}, title = {A Note on Testing Logic Circuits by Transition Counting}, journal ={IEEE Transactions on Computers}, volume = {26}, number = {3}, issn = {0018-9340}, year = {1977}, pages = {313-314}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1977.1674831}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - A Note on Testing Logic Circuits by Transition Counting IS - 3 SN - 0018-9340 SP313 EP314 EPD - 313-314 A1 - S.M. Reddy, PY - 1977 KW - Single and multiple faults KW - transition count testing. VL - 26 JA - IEEE Transactions on Computers ER - | |||
Test sets to detect single and multiple stuck-at faults in combinational networks by transition counting are given.
Index Terms:
Single and multiple faults, transition count testing.
Citation:
S.M. Reddy, "A Note on Testing Logic Circuits by Transition Counting," IEEE Transactions on Computers, vol. 26, no. 3, pp. 313-314, March 1977, doi:10.1109/TC.1977.1674831
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