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System Diagnosis and Redundant Tests
November 1976 (vol. 25 no. 11)
pp. 1167-1170
| ASCII Text | x | ||
| S. Toida, "System Diagnosis and Redundant Tests," IEEE Transactions on Computers, vol. 25, no. 11, pp. 1167-1170, November, 1976. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1976.1674575, author = {S. Toida}, title = {System Diagnosis and Redundant Tests}, journal ={IEEE Transactions on Computers}, volume = {25}, number = {11}, issn = {0018-9340}, year = {1976}, pages = {1167-1170}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1976.1674575}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - System Diagnosis and Redundant Tests IS - 11 SN - 0018-9340 SP1167 EP1170 EPD - 1167-1170 A1 - S. Toida, PY - 1976 KW - Fault diagnosis KW - redundant tests KW - self-checking KW - test connections. VL - 25 JA - IEEE Transactions on Computers ER - | |||
If the addition of a test does not improve the diagdosability of a system the test is called redundant. It is shown that if at least one test is nonredundant, then the previous algorithms to determine the diagnosability [2],[3] can be further improved. It is also shown how and when the diagnosability of a system can be improved by the addition of an extra test.
Index Terms:
Fault diagnosis, redundant tests, self-checking, test connections.
Citation:
S. Toida, "System Diagnosis and Redundant Tests," IEEE Transactions on Computers, vol. 25, no. 11, pp. 1167-1170, Nov. 1976, doi:10.1109/TC.1976.1674575
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