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S.R. Das, Institute of Radiophysics and Electronics, University of Calcutta
This correspondence comments on certain aspects of a recent paper1 by Marinos relating to derivation of minimal complete sets of test-input sequences to detect stuck-at faults in combinational switching circuits utilizing the concept of Boolean difference. The primary motivation behind this move is to mention some minor inconsistencies, inaccuracies, and deficiencies involving certain key concepts of the paper, and also to generalize some useful results of the author, adding thereby to the utility and worth of the contribution.
Index Terms:
Boolean difference, companion set, embedded minterm, fault detection in combinational circuits.
Citation:
S.R. Das, C.R. Datta, P.K. Srimani, K. Mandal, "Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences"," IEEE Transactions on Computers, vol. 25, no. 10, pp. 1053-1056, Oct. 1976, doi:10.1109/TC.1976.1674548
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