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Issue No.07 - July (1976 vol.25)
pp: 725-736
R.W. Ehrich , Department of Electrical and Computer Engineering, University of Massachusetts
ABSTRACT
In a number of applications of image processing, much information about objects or textures in the image can be obtained by sequential analysis of individual scan lines.
INDEX TERMS
Peak, scan line, stack, texture, tree, valley.
CITATION
R.W. Ehrich, J.P. Foith, "Representation of Random Waveforms by Relational Trees", IEEE Transactions on Computers, vol.25, no. 7, pp. 725-736, July 1976, doi:10.1109/TC.1976.1674681
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