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Representation of Random Waveforms by Relational Trees
July 1976 (vol. 25 no. 7)
pp. 725-736
R.W. Ehrich, Department of Electrical and Computer Engineering, University of Massachusetts
In a number of applications of image processing, much information about objects or textures in the image can be obtained by sequential analysis of individual scan lines.
Index Terms:
Peak, scan line, stack, texture, tree, valley.
Citation:
R.W. Ehrich, J.P. Foith, "Representation of Random Waveforms by Relational Trees," IEEE Transactions on Computers, vol. 25, no. 7, pp. 725-736, July 1976, doi:10.1109/TC.1976.1674681
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