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| ASCII Text | x | ||
| P. Agrawal, V.D. Agrawal, "On Monte Carlo Testing of Logic Tree Networks," IEEE Transactions on Computers, vol. 25, no. 6, pp. 664-667, June, 1976. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1976.1674670, author = {P. Agrawal and V.D. Agrawal}, title = {On Monte Carlo Testing of Logic Tree Networks}, journal ={IEEE Transactions on Computers}, volume = {25}, number = {6}, issn = {0018-9340}, year = {1976}, pages = {664-667}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1976.1674670}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - On Monte Carlo Testing of Logic Tree Networks IS - 6 SN - 0018-9340 SP664 EP667 EPD - 664-667 A1 - P. Agrawal, A1 - V.D. Agrawal, PY - 1976 KW - Combinational tree networks KW - detection probability KW - fault detection KW - logic testing KW - random test generation. VL - 25 JA - IEEE Transactions on Computers ER - | |||
It is shown that by a proper selection of the probabilities of 0 and 1 at the inputs, the efficiency of random test generation can be improved. This correspondence includes some results describing the testing of actual logic networks used in a computer.
Index Terms:
Combinational tree networks, detection probability, fault detection, logic testing, random test generation.
Citation:
P. Agrawal, V.D. Agrawal, "On Monte Carlo Testing of Logic Tree Networks," IEEE Transactions on Computers, vol. 25, no. 6, pp. 664-667, June 1976, doi:10.1109/TC.1976.1674670
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