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On Monte Carlo Testing of Logic Tree Networks
June 1976 (vol. 25 no. 6)
pp. 664-667
P. Agrawal, Department of Electrical Engineering, University of Southern California
It is shown that by a proper selection of the probabilities of 0 and 1 at the inputs, the efficiency of random test generation can be improved. This correspondence includes some results describing the testing of actual logic networks used in a computer.
Index Terms:
Combinational tree networks, detection probability, fault detection, logic testing, random test generation.
Citation:
P. Agrawal, V.D. Agrawal, "On Monte Carlo Testing of Logic Tree Networks," IEEE Transactions on Computers, vol. 25, no. 6, pp. 664-667, June 1976, doi:10.1109/TC.1976.1674670
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