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Recursion and Testing of Combinational Circuits
June 1976 (vol. 25 no. 6)
pp. 652-654
C. Turcat, ENSIMAG, University of Grenoble
This correspondence shows how recursion can be used to simplify testing of combinational circuits. Necessary and sufficient conditions for testing simple iterative arrays (one-dimensional) with a fixed number of tests (independent of the number of cells) are given. Multiple faults and diagnosis in such circuits are also studied. The extension of the concept of simple iteration to complex iteration that may realize more complex recursive functions, is defined. Examples of such complex iterative circuits are studied.
Index Terms:
Fault detection, fault diagnosis, iterative array, recursive function.
Citation:
C. Turcat, A. Verdillon, "Recursion and Testing of Combinational Circuits," IEEE Transactions on Computers, vol. 25, no. 6, pp. 652-654, June 1976, doi:10.1109/TC.1976.1674667
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