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A Nine-Valued Circuit Model for Test Generation
June 1976 (vol. 25 no. 6)
pp. 630-636
P. Muth, Brown, Boveri, and Cie AG
A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple and repeated effects of faults on the internal state of a sequential circuit. Thus valid test sequences are derived where other known procedures, like the D-algorithm, do not find any test although one exists.
Index Terms:
Circuit testing, D-algorithm, diagnosis, many-valued model, sequential circuit, single and multiple faults, test generation.
Citation:
P. Muth, "A Nine-Valued Circuit Model for Test Generation," IEEE Transactions on Computers, vol. 25, no. 6, pp. 630-636, June 1976, doi:10.1109/TC.1976.1674663
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