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June 1976 (vol. 25 no. 6)
pp. 594-604
| ASCII Text | x | ||
| R.P. Batni, C.R. Kime, "A Module-Level Testing Approach for Combinational Networks," IEEE Transactions on Computers, vol. 25, no. 6, pp. 594-604, June, 1976. | |||
| BibTex | x | ||
| @article{ 10.1109/TC.1976.1674659, author = {R.P. Batni and C.R. Kime}, title = {A Module-Level Testing Approach for Combinational Networks}, journal ={IEEE Transactions on Computers}, volume = {25}, number = {6}, issn = {0018-9340}, year = {1976}, pages = {594-604}, doi = {http://doi.ieeecomputersociety.org/10.1109/TC.1976.1674659}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - A Module-Level Testing Approach for Combinational Networks IS - 6 SN - 0018-9340 SP594 EP604 EPD - 594-604 A1 - R.P. Batni, A1 - C.R. Kime, PY - 1976 KW - B-transformation KW - combinational networks KW - effective blocking technique KW - fault detection tests KW - module-level testing. VL - 25 JA - IEEE Transactions on Computers ER - | |||
A module-level testing approach for combinational networks which employs hardware modification and a simplified test generation procedure is described. The approach is based on a directed graph model for the network derived at the module level. The objectives of the approach are to deal with testing directly at the module level, to use cataloged tests for the modules in the network environment, and to generate a fault detection test set with "good" fault location capability. Networks which consist of single-output modules are treated initially and then the results are extended to networks which consist of multiple-output modules. Hardware modification and test generation procedures are illustrated.
Index Terms:
B-transformation, combinational networks, effective blocking technique, fault detection tests, module-level testing.
Citation:
R.P. Batni, C.R. Kime, "A Module-Level Testing Approach for Combinational Networks," IEEE Transactions on Computers, vol. 25, no. 6, pp. 594-604, June 1976, doi:10.1109/TC.1976.1674659
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