This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
June 1976 (vol. 25 no. 6)
pp. 594-604
R.P. Batni, Bell Laboratories
A module-level testing approach for combinational networks which employs hardware modification and a simplified test generation procedure is described. The approach is based on a directed graph model for the network derived at the module level. The objectives of the approach are to deal with testing directly at the module level, to use cataloged tests for the modules in the network environment, and to generate a fault detection test set with "good" fault location capability. Networks which consist of single-output modules are treated initially and then the results are extended to networks which consist of multiple-output modules. Hardware modification and test generation procedures are illustrated.
Index Terms:
B-transformation, combinational networks, effective blocking technique, fault detection tests, module-level testing.
Citation:
R.P. Batni, C.R. Kime, "A Module-Level Testing Approach for Combinational Networks," IEEE Transactions on Computers, vol. 25, no. 6, pp. 594-604, June 1976, doi:10.1109/TC.1976.1674659
Usage of this product signifies your acceptance of the Terms of Use.