This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
System Fault Diagnosis: Closure and Diagnosability with Repair
November 1975 (vol. 24 no. 11)
pp. 1078-1089
J.D. Russell, Collins Avionics Division, Rockwell International
Determination of the detectability and diagnosability of a digital system containing at most t faulty system components is considered. The model employed is to an extent independent of the means used to implement diagnostic procedures, i.e., whether the tests are accomplished via hardware, software, or combinations thereof. A parameter, called the closure index, is defined which characterizes the capability for executing valid tests in the presence of faults. The closure index can be thought of as the size of the smallest potentially undetectable multiple-fault in the system as modeled. On the basis of this parameter, results are presented which permit the determination of t-fault detectability and t-fault diagnosability with repair for the system. Examples are presented to illustrate the application of the model for systems close to those encountered in actual practice.
Index Terms:
Closure index, diagnostic modeling, diagnosable digital systems, fault detection and diagnosis, fault-tolerant computing.
Citation:
J.D. Russell, C.R. Kime, "System Fault Diagnosis: Closure and Diagnosability with Repair," IEEE Transactions on Computers, vol. 24, no. 11, pp. 1078-1089, Nov. 1975, doi:10.1109/T-C.1975.224136
Usage of this product signifies your acceptance of the Terms of Use.