Issue No.10 - October (1975 vol.24)
S.C. Hu , Department of Electrical Engineering, Cleveland State University
Logic gates subject to asymmetric input faults may be made more reliable by employing redundant inputs. A mathematical expression for determining the optimum number of redundant inputs based on input reliabilities of the gate is developed. The development follows the theory of combinatorial probability.
Asymmetric input-faults, input redundancy, logic gate, probability, reliability.
S.C. Hu, "A Probabilistic Approach of Designing More Reliable Logic Gates with Asymmetric Input Faults", IEEE Transactions on Computers, vol.24, no. 10, pp. 1012-1014, October 1975, doi:10.1109/T-C.1975.224113