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Properties of Faults and Criticalities of Values under Tests for Combinational Networks
July 1975 (vol. 24 no. 7)
pp. 746-750
D.T. Wang, System Products Division, IBM Corporation
This correspondence discusses the properties of faults in combinational networks and their relationships with fault-detection and fault-location test sets.
Index Terms:
Criticality of values under test, fault equivalence, fault detection, fault dominance, fault location, fault masking, test generation.
Citation:
D.T. Wang, "Properties of Faults and Criticalities of Values under Tests for Combinational Networks," IEEE Transactions on Computers, vol. 24, no. 7, pp. 746-750, July 1975, doi:10.1109/T-C.1975.224296
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