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Issue No.07 - July (1975 vol.24)
pp: 742-746
D.T. Wang , System Products Division, IBM Corporation
ABSTRACT
An algorithm is developed for generating a single-fault detection test set to be used in a combinational logic network. This algorithm has two unique characteristics. 1) When a test is generated, a list of faults detected by this test is available. Fault simulation, therefore, is not required after the test has been generated. 2) It generates a test set rather than a single test. Each test, with the exception of the first one, is based on a previous test. Repetition of effort and overlapped coverage of faults for different test generations are thus reduced.
INDEX TERMS
Combinational networks, criticality of line values under test, fault detection, test generation, test set generation.
CITATION
D.T. Wang, "An Algorithm for the Generation of Test Sets for Combinational Logic Networks", IEEE Transactions on Computers, vol.24, no. 7, pp. 742-746, July 1975, doi:10.1109/T-C.1975.224295
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