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An Algorithm for the Generation of Test Sets for Combinational Logic Networks
July 1975 (vol. 24 no. 7)
pp. 742-746
D.T. Wang, System Products Division, IBM Corporation
An algorithm is developed for generating a single-fault detection test set to be used in a combinational logic network. This algorithm has two unique characteristics. 1) When a test is generated, a list of faults detected by this test is available. Fault simulation, therefore, is not required after the test has been generated. 2) It generates a test set rather than a single test. Each test, with the exception of the first one, is based on a previous test. Repetition of effort and overlapped coverage of faults for different test generations are thus reduced.
Index Terms:
Combinational networks, criticality of line values under test, fault detection, test generation, test set generation.
Citation:
D.T. Wang, "An Algorithm for the Generation of Test Sets for Combinational Logic Networks," IEEE Transactions on Computers, vol. 24, no. 7, pp. 742-746, July 1975, doi:10.1109/T-C.1975.224295
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