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February 1975 (vol. 24 no. 2)
pp. 150-157
J.P. Hayes, Department of Electrical Engineering and the Computer Science Program, University of Southern California
Some formal models for pattern-sensitive faults (PSF's) in random-access memories are presented. The problem of detecting unrestricted PSF's is that of constructing a checking sequence for the memory. An efficient procedure for constructing such a checking sequence is presented. A local PSF is defined as a PSF where the faulty behavior of a memory cell Cidepends on a fixed group of cell
Index Terms:
Checking experiments, fault detection, pattern-sensitive faults, random-access memories.
Citation:
J.P. Hayes, "Detection oF Pattern-Sensitive Faults in Random-Access Memories," IEEE Transactions on Computers, vol. 24, no. 2, pp. 150-157, Feb. 1975, doi:10.1109/T-C.1975.224182
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