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Issue No.02 - February (1975 vol.24)
pp: 150-157
J.P. Hayes , Department of Electrical Engineering and the Computer Science Program, University of Southern California
ABSTRACT
Some formal models for pattern-sensitive faults (PSF's) in random-access memories are presented. The problem of detecting unrestricted PSF's is that of constructing a checking sequence for the memory. An efficient procedure for constructing such a checking sequence is presented. A local PSF is defined as a PSF where the faulty behavior of a memory cell C<inf>i</inf>depends on a fixed group of cell
INDEX TERMS
Checking experiments, fault detection, pattern-sensitive faults, random-access memories.
CITATION
J.P. Hayes, "Detection oF Pattern-Sensitive Faults in Random-Access Memories", IEEE Transactions on Computers, vol.24, no. 2, pp. 150-157, February 1975, doi:10.1109/T-C.1975.224182
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