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February 1975 (vol. 24 no. 2)
pp. 150-157
| ASCII Text | x | ||
| J.P. Hayes, "Detection oF Pattern-Sensitive Faults in Random-Access Memories," IEEE Transactions on Computers, vol. 24, no. 2, pp. 150-157, February, 1975. | |||
| BibTex | x | ||
| @article{ 10.1109/T-C.1975.224182, author = {J.P. Hayes}, title = {Detection oF Pattern-Sensitive Faults in Random-Access Memories}, journal ={IEEE Transactions on Computers}, volume = {24}, number = {2}, issn = {0018-9340}, year = {1975}, pages = {150-157}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1975.224182}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Detection oF Pattern-Sensitive Faults in Random-Access Memories IS - 2 SN - 0018-9340 SP150 EP157 EPD - 150-157 A1 - J.P. Hayes, PY - 1975 KW - Checking experiments KW - fault detection KW - pattern-sensitive faults KW - random-access memories. VL - 24 JA - IEEE Transactions on Computers ER - | |||
Some formal models for pattern-sensitive faults (PSF's) in random-access memories are presented. The problem of detecting unrestricted PSF's is that of constructing a checking sequence for the memory. An efficient procedure for constructing such a checking sequence is presented. A local PSF is defined as a PSF where the faulty behavior of a memory cell Ci depends on a fixed group of cell
Index Terms:
Checking experiments, fault detection, pattern-sensitive faults, random-access memories.
Citation:
J.P. Hayes, "Detection oF Pattern-Sensitive Faults in Random-Access Memories," IEEE Transactions on Computers, vol. 24, no. 2, pp. 150-157, Feb. 1975, doi:10.1109/T-C.1975.224182
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