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Issue No.09 - September (vol.23)
ISSN: 0018-9340
TABLE OF CONTENTS
Papers
J.H. Friedman , Stanford Linear Accelerator Center
pp. 881-890
K.K. Burhardt , 3M Company
pp. 890-897
W.K. Giloi , the Department of Computer, Information, and Control Sciences, University of Minnesota
pp. 897-906
F. Rubin , System Development Division, IBM Corporation
pp. 907-914
F. Barsi , Istituto di Elaborazione dell'Informazione, Consiglio Nazionale delle Ricerche
pp. 915-924
R.J. Smith , Department of Electrical Engineering and Computer Science, Southern Methodist University
pp. 924-932
L. Hakkala , Applied Electronics Laboratory, Helsinki University of Technology
pp. 932-941
null Ming-Duenn Ni , Department of Electrical Engineering and the Electronics Research Center, University of Texas
pp. 942-954
B.K. Roy , Hughes Aircraft Company
pp. 955-963
R.L. Richardson , Math and Physics Research Department, Battelle Pacific Northwest Laboratories
pp. 964-966
J.C. Hassab , Special Projects Group, Naval Underwater Systems Center
pp. 967
L.G. Delcaro , Istituto di Elettrotecnica e di Elettronica, Universit? di Trieste
pp. 967-970
S.M. Selkow , D?partment d'Informatique, Universit?de Montr?al
pp. 970-971
G.M. Bednar , Systems Development Division, IBM
pp. 971-976
A.E. Kahveci , Department of Electrical Engineering, University of Missouri
pp. 976-981
S. Chakrabarti , Department of Applied Mathematics, Indian Institute of Science
pp. 981-983
W. Del Picchia , Departamento de Engenharia de Eletricidade, Escola Polit?cnica da Universidade de S?o Paulo
pp. 983-986
S. Marjanovic , Faculty of Electrical Engineering, University of Belgrade, Belgrade, Yugoslavia and the Mihailo Pupin Institute
pp. 986-988
C.C. Babu , Instrumentation and Control Systems Laboratory
pp. 989
S. Zohar , Jet Propulsion Laboratory, California Institute of Technology
pp. 989
T. Ibaraki , Department of Applied Mathematics and Physics, Faculty of Engineering, Kyoto University
pp. 989-990
S.J. Wallach , Raytheon Co. Hartwell Rd.
pp. 990-991
D. Siewiorek , Dept. of Computer Science Carnegie-Mellon University
pp. 991-992
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