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Diagnosis and Fault Equivalence in Combinational Circuits
September 1974 (vol. 23 no. 9)
pp. 955-963
B.K. Roy, Hughes Aircraft Company
Two procedures are presented: one for diagnosis of single-gate failures and the other for deriving equivalence classes of single faults. Both procedures require use of a diagnostic table which lists gate sensitivities and primary output values for all input patterns in a set of tests which contains at most U tests, where U is an upper bound derived in the text. A gate is defined to be an n-input single-output combinational circuit (n = 1) and a failure is any detectable transformation of the correct gate function. The information contained in a diagnostic table can be used to locate a faulty gate and describe its failed function. Equivalence classes are derived from a diagnostic table by first specifying the primary output values in accordance with a theorem given in the text and then deriving the corresponding gate functions. Examples are given to illustrate both the procedures.
Index Terms:
Combinational circuits, equivalence classes, fault diagnosis, fault testing, single-gate failures.
Citation:
B.K. Roy, "Diagnosis and Fault Equivalence in Combinational Circuits," IEEE Transactions on Computers, vol. 23, no. 9, pp. 955-963, Sept. 1974, doi:10.1109/T-C.1974.224059
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