An Examination of Algebraic Test Generation Methods for Multiple Faults

B.D. Carroll; H.G. Shah; D.M. Jones

doi:10.1109/T-C.1974.224024

Publication
1974
Issue No. 7 - July
Abstract - An Examination of Algebraic Test Generation Methods for Multiple Faults

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An Examination of Algebraic Test Generation Methods for Multiple Faults

July 1974 (vol. 23 no. 7)

pp. 743-745

	ASCII Text	x
	B.D. Carroll, H.G. Shah, D.M. Jones, "An Examination of Algebraic Test Generation Methods for Multiple Faults," IEEE Transactions on Computers, vol. 23, no. 7, pp. 743-745, July, 1974.

	BibTex	x
	@article{ 10.1109/T-C.1974.224024, author = {B.D. Carroll and H.G. Shah and D.M. Jones}, title = {An Examination of Algebraic Test Generation Methods for Multiple Faults}, journal ={IEEE Transactions on Computers}, volume = {23}, number = {7}, issn = {0018-9340}, year = {1974}, pages = {743-745}, doi = {http://doi.ieeecomputersociety.org/10.1109/T-C.1974.224024}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - JOUR JO - IEEE Transactions on Computers TI - An Examination of Algebraic Test Generation Methods for Multiple Faults IS - 7 SN - 0018-9340 SP743 EP745 EPD - 743-745 A1 - B.D. Carroll, A1 - H.G. Shah, A1 - D.M. Jones, PY - 1974 KW - Boolean difference KW - combinational logic circuits KW - fault diagnosis KW - multiple faults KW - test generation. VL - 23 JA - IEEE Transactions on Computers ER -

B.D. Carroll, Department of Electrical Engineering, Auburn University

H.G. Shah

D.M. Jones

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/T-C.1974.224024

A generalized test function (GTF) is derived that gives all tests for a multiple stuck-at fault in a combinational logic circuit. The GTF is then used as the basis for an examination of several algebraic test generation methods that have appeared in the literature. Deficiencies are found in some methods.

Index Terms:

Boolean difference, combinational logic circuits, fault diagnosis, multiple faults, test generation.

Citation:

B.D. Carroll, H.G. Shah, D.M. Jones, "An Examination of Algebraic Test Generation Methods for Multiple Faults," IEEE Transactions on Computers, vol. 23, no. 7, pp. 743-745, July 1974, doi:10.1109/T-C.1974.224024

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