The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.07 - July (1974 vol.23)
pp: 743-745
B.D. Carroll , Department of Electrical Engineering, Auburn University
ABSTRACT
A generalized test function (GTF) is derived that gives all tests for a multiple stuck-at fault in a combinational logic circuit. The GTF is then used as the basis for an examination of several algebraic test generation methods that have appeared in the literature. Deficiencies are found in some methods.
INDEX TERMS
Boolean difference, combinational logic circuits, fault diagnosis, multiple faults, test generation.
CITATION
B.D. Carroll, H.G. Shah, D.M. Jones, "An Examination of Algebraic Test Generation Methods for Multiple Faults", IEEE Transactions on Computers, vol.23, no. 7, pp. 743-745, July 1974, doi:10.1109/T-C.1974.224024
1056 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool